Bin-to-bin spectrum reconstruction method for analyzing ?-rays passing through a certain thickness of aluminum

dc.authorscopusid18533626200
dc.authorscopusid57194208654
dc.authorscopusid57194206139
dc.contributor.authorAlmaz, Ekrem
dc.contributor.authorAkyol, Ahmet
dc.contributor.authorTokgöz, Emrullah
dc.date.accessioned2023-01-10T21:23:27Z
dc.date.available2023-01-10T21:23:27Z
dc.date.issued2017
dc.departmentFakülteler, Fen-Edebiyat Fakültesi, Fizik Bölümüen_US
dc.descriptionAgri Ibrahim Cecen University;IC Foudationen_US
dc.description2nd International Conference on Advances in Natural and Applied Sciences, ICANAS 2017 -- 18 April 2017 through 21 April 2017 -- 127507en_US
dc.description.abstractEnergy distribution of Y-rays emitted from standard sources, passing through various thicknesses of Al medium, were obtained by using 5.08cm x 5.08cm NaI(Tl) detector. The full energy peak and the total efficiency, photopeak/total (P/T) ratios and energy resolution of NaI(Tl) detector were measured using standard Y-ray sources. Detector response functions (DRFs) were obtained in every energy value of Y-ray rays by means of P/T ratios and energy resolutions. Y-rays incoming to the slice-shape geometry medium, can take all the energy values between 0 and the maximum energy. The energy range is divided into n lower energy region. DRFs are obtained for the energy values correspond to the midpoint of each energy range. In this way, the response matrix is developed. A bin to bin unfolding method is applied to the Y-ray spectra and the results are compared with the spectra obtained by the Monte Carlo method. © 2017 Author(s).en_US
dc.identifier.doi10.1063/1.4981756
dc.identifier.isbn9780735415034
dc.identifier.issn0094-243X
dc.identifier.scopus2-s2.0-85019249855
dc.identifier.scopusqualityQ4
dc.identifier.urihttps://doi.org/10.1063/1.4981756
dc.identifier.urihttps://doi.org/10.1063/1.4981756
dc.identifier.urihttps://hdl.handle.net/20.500.12639/4925
dc.identifier.urihttps://doi.org/10.1063/1.4981756
dc.identifier.urihttps://hdl.handle.net/20.500.12639/4925
dc.identifier.volume1833en_US
dc.identifier.wosWOS:000405093100108
dc.identifier.wosqualityN/A
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthorAlmaz, Ekrem
dc.language.isoen
dc.publisherAmerican Institute of Physics Inc.en_US
dc.relation.ispartofAIP Conference Proceedingsen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectdetector response functionen_US
dc.subjectenergy distribution of ?-raysen_US
dc.subjectNaI(Tl) detectoren_US
dc.subjectunfoldingen_US
dc.titleBin-to-bin spectrum reconstruction method for analyzing ?-rays passing through a certain thickness of aluminumen_US
dc.typeArticle

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